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Scattered light dust measuring devices
FWE200

Extractive dust measuring system for wet gases

Your Benefits

  • Reliable dust measurement in wet gas
  • No moving parts in contact with aggressive gas, therefore low maintenance
  • Mounting directly at the duct due to compact design

Overview

Extractive dust measuring system for wet gases

The FWE200 dust measuring device is designed to measure dust concentrations in wet flue gas. The gas is extracted via a sampling probe and heated above dew point. Droplets in the gas are vaporized, making it impossible for them to falsify the measurement results. The scattered light principle enables even very low dust concentrations to be measured.

At a glance
  • For very low to medium dust concentrations
  • Gas sampling and return combined in one probe
  • Contamination check
  • Automatic check of zero and reference point

Accessories

Applications

Service & Support

Service & Support

Technical overview

 

Please note: The exact device specifications and performance data of the product may deviate from the information provided here, and depend on the application in which the product is being used and the relevant customer specifications.

  • FWE200 system

    FWE200 system

    Measured valuesScattered light intensity, dust concentration (after gravimetric comparison measurement)
    Performance-tested measurandsDust concentration
    Measurement principlesScattered light forward
    Spectral range
    640 nm ... 660 nm
    Laser, protection class 2, power < 1 mW
    Measuring ranges
    Dust concentration0 ... 5 mg/m³ / 0 ... 200 mg/m³
    Measuring ranges freely selectable
    Higher measuring ranges on request
    Certified measuring ranges
    Dust concentration0 ... 15 mg/m³ / 0 ... 50 mg/m³
    Response time (t90)
    0.1 s ... 600 s
    Freely adjustable
    Accuracy
    ± 2 %
    Of measuring range full scale
    Process temperature
    PVDF probe≤ +120 °C
    Hastelloy probe≤ +220 °C
    Process pressure
    –20 hPa ... 20 hPa
    Process gas velocity
    4 m/s ... 20 m/s
    Process gas humidity
    Max. 10 g/m³ liquid water without water vapour
    Ambient temperature
    –20 °C ... +50 °C
    Conformities

    Approved for plants requiring approval

    2001/80/EC (13. BImSchV)

    2000/76/EC (17. BImSchV)

    27.BImSchV

    TA-Luft (Prevention of Air Pollution)

    EN 15267

    EN 14181

    MCERTS

    U.S. EPA PS-11 compliant

    Electrical safetyCE
    Enclosure rating
    SystemIP54
    Electronics enclosureIP65
    Analog outputs1 output:
    0/2/4 ... 20 mA, 750 Ω
    Electrically isolated, second output as option
    Digital outputs4 relay contacts:
    + 250 V, 1 A
    Preset for failure, warning, limit value and maintenance
    Digital inputs1 input:
    Potential-free, for maintenance switch
    Serial
    Type of fieldbus integrationRS-232
    FunctionProprietary service interface
    OperationMenu-driven operation via control unit
    Dimensions (W x H x D)
    FWE200 measuring and control unit730 mm x 830 mm x 340 mm
    For details see dimensional drawings
    Weight
    FWE200 measuring and control unit65 kg
    Sampling probe≤ 15 kg
    Power supply
    Voltage115 V / 230 V
    Frequency47 ... 63 Hz
    Power consumption≤ 2.5 kW
    OptionsFWE200 mounting rack
  • SLV4-2 purge air unit, 2BH1300, 1-ph

    SLV4-2 purge air unit, 2BH1300, 1-ph

    DescriptionUnit to provide dust-free air for flushing of optical surfaces
    Gas flow rate
    38 m³/h ... 63 m³/h
    At 30 hPa counter pressure, depending on low pressure inside the filter
    Ambient temperature
    –20 °C ... +40 °C
    Enclosure rating
    IP54
    Dimensions (W x H x D)
    550 mm x 550 mm x 258 mm
    For details see dimensional drawings
    Weight
    18 kg
    Power supply
    Voltage230 V / 115 V
    Frequency50 Hz / 60 Hz
    Current consumption≤ 6 A
    Power consumption≤ 450 W
    Auxiliary gas connections
    Purge air40 mm
    Test functionsPressure switch (switching point –35 hPa)
    Integrated components2-step air filter, type Europiclon, dust capacity 200 g
All technical data can be found accompanying the individual product

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